• Tomography Inspection

Tomography Inspection


Measure layered images of samples using Tomography Inspection technology

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Penetrating, layer-by-layer scanning of multi-layer structural elements using SSI's exclusive Tomography Inspection technology.

It is suitable for multi-layer structure inspection, material thickness, structural defects, surface flatness and other related requirements.

Applicable sample rangeGaAsLCDPolished wafer with gluePolished waferRough waferMultiple pieces of glassMulti-layer thin filmWafer with tapGlue with bubble、Wafer/polymer/glass plateMolding compound on wafer



GaAs Structure Scan

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LCD defect judgment

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Quartz oscillator double crystal failure

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