Tomography Inspection

Measure layered images of samples using Tomography Inspection technology

Penetrating, layer-by-layer scanning of multi-layer structural elements using SSI's exclusive Tomography Inspection technology.

It is suitable for multi-layer structure inspection, material thickness, structural defects, surface flatness and other related requirements.

Applicable sample range：GaAs、LCD、Polished wafer with glue、Polished wafer、Rough wafer、Multiple pieces of glass、Multi-layer thin film、Wafer with tap、Glue with bubble、Wafer/polymer/glass plate、Molding compound on wafer。

GaAs Structure Scan

LCD defect judgment

Quartz oscillator double crystal failure