• Tomography Inspection

Tomography Inspection

Measure layered images of samples using Tomography Inspection technology


Penetrating, layer-by-layer scanning of multi-layer structural elements using SSI's exclusive Tomography Inspection technology.

It is suitable for multi-layer structure inspection, material thickness, structural defects, surface flatness and other related requirements.

Applicable sample rangeGaAsLCDPolished wafer with gluePolished waferRough waferMultiple pieces of glassMulti-layer thin filmWafer with tapGlue with bubble、Wafer/polymer/glass plateMolding compound on wafer

GaAs Structure Scan


LCD defect judgment


Quartz oscillator double crystal failure


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